Huaping He, Fan Min. Accumulated Cost Based Test-Cost-Sensitive Attribute Reduction. In Sergei O. Kuznetsov, Dominik Slezak, Daryl H. Hepting, Boris Mirkin, editors, Rough Sets, Fuzzy Sets, Data Mining and Granular Computing - 13th International Conference, RSFDGrC 2011, Moscow, Russia, June 25-27, 2011. Proceedings. Volume 6743 of Lecture Notes in Computer Science, pages 244-247, Springer, 2011. [doi]
Abstract is missing.