Wenjun He, Guanghui Min, Oleg Tolochko. In-situ high temperature XRD studies and crystallization behavior of a Ti-rich Ti-Ni-Cu ribbon. In International Conference on Electronic and Mechanical Engineering and Information Technology, EMEIT 2011, Harbin, Heilongjiang, China, 12-14 August, 2011. pages 4732-4736, IEEE, 2011. [doi]
@inproceedings{HeMT11-1,
title = {In-situ high temperature XRD studies and crystallization behavior of a Ti-rich Ti-Ni-Cu ribbon},
author = {Wenjun He and Guanghui Min and Oleg Tolochko},
year = {2011},
doi = {10.1109/EMEIT.2011.6024093},
url = {http://dx.doi.org/10.1109/EMEIT.2011.6024093},
researchr = {https://researchr.org/publication/HeMT11-1},
cites = {0},
citedby = {0},
pages = {4732-4736},
booktitle = {International Conference on Electronic and Mechanical Engineering and Information Technology, EMEIT 2011, Harbin, Heilongjiang, China, 12-14 August, 2011},
publisher = {IEEE},
isbn = {978-1-61284-087-1},
}