Simulation-Driven Thermal-Safe Test Time Minimization for System-on-Chip

Zhiyuan He, Zebo Peng, Petru Eles. Simulation-Driven Thermal-Safe Test Time Minimization for System-on-Chip. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 283-288, IEEE Computer Society, 2008. [doi]

Authors

Zhiyuan He

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Zebo Peng

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Petru Eles

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