Q. Peter He, Jin Wang. Statistical process monitoring in the era of smart manufacturing. In 2017 American Control Conference, ACC 2017, Seattle, WA, USA, May 24-26, 2017. pages 4797-4802, IEEE, 2017. [doi]
@inproceedings{HeW17-2,
title = {Statistical process monitoring in the era of smart manufacturing},
author = {Q. Peter He and Jin Wang},
year = {2017},
doi = {10.23919/ACC.2017.7963697},
url = {https://doi.org/10.23919/ACC.2017.7963697},
researchr = {https://researchr.org/publication/HeW17-2},
cites = {0},
citedby = {0},
pages = {4797-4802},
booktitle = {2017 American Control Conference, ACC 2017, Seattle, WA, USA, May 24-26, 2017},
publisher = {IEEE},
isbn = {978-1-5090-5992-8},
}