ABF-YOLO: A Fine-Grained PCB Defect Detection Framework Integrating Axial Attention and Bidirectional Feature Fusion

Xiaoyao He, Mingyang Xie. ABF-YOLO: A Fine-Grained PCB Defect Detection Framework Integrating Axial Attention and Bidirectional Feature Fusion. IEEE Trans. Consumer Electronics, 71(3):8562-8570, August 2025. [doi]

Abstract

Abstract is missing.