Jieying He, Shengwei Zhang. Analysis of System Linearity Caused by Gain Variation for Microsat-Based Microwave Radiometer. In IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2020, Waikoloa, HI, USA, September 26 - October 2, 2020. pages 6361-6364, IEEE, 2020. [doi]
@inproceedings{HeZ20-8,
title = {Analysis of System Linearity Caused by Gain Variation for Microsat-Based Microwave Radiometer},
author = {Jieying He and Shengwei Zhang},
year = {2020},
doi = {10.1109/IGARSS39084.2020.9323910},
url = {https://doi.org/10.1109/IGARSS39084.2020.9323910},
researchr = {https://researchr.org/publication/HeZ20-8},
cites = {0},
citedby = {0},
pages = {6361-6364},
booktitle = {IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2020, Waikoloa, HI, USA, September 26 - October 2, 2020},
publisher = {IEEE},
isbn = {978-1-7281-6374-1},
}