Jieying He, Shengwei Zhang. Analysis of System Linearity Caused by Gain Variation for Microsat-Based Microwave Radiometer. In IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2020, Waikoloa, HI, USA, September 26 - October 2, 2020. pages 6361-6364, IEEE, 2020. [doi]
Abstract is missing.