Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Jin He, Xing Zhang, Ru Huang, Yangyuan Wang. Extraction of the lateral distribution of interface traps in MOSFETs by a novel combined gated-diode technique. Microelectronics Reliability, 41(12):1953-1957, 2001. [doi]
Abstract is missing.