Doug Heaberlin. The Power of Exhaustive Bridge Diagnosis using IDDQ Speed, Confidence, and Resolution. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]
@inproceedings{Heaberlin06,
title = {The Power of Exhaustive Bridge Diagnosis using IDDQ Speed, Confidence, and Resolution},
author = {Doug Heaberlin},
year = {2006},
doi = {10.1109/TEST.2006.297692},
url = {http://dx.doi.org/10.1109/TEST.2006.297692},
researchr = {https://researchr.org/publication/Heaberlin06},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006},
editor = {Scott Davidson and Anne Gattiker},
publisher = {IEEE},
isbn = {1-4244-0292-1},
}