Covering both stack and states while testing push-down systems

Pierre-Cyrille Héam, Hana M'Hemdi. Covering both stack and states while testing push-down systems. In Eighth IEEE International Conference on Software Testing, Verification and Validation, ICST 2015 Workshops, Graz, Austria, April 13-17, 2015. pages 1-7, IEEE Computer Society, 2015. [doi]

Abstract

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