Toward a reliability measurement framework automated using deep learning

John Heaps, Xueling Zhang, Xiaoyin Wang, Travis D. Breaux, Jianwei Niu 0001. Toward a reliability measurement framework automated using deep learning. In Xenofon D. Koutsoukos, Alvaro A. Cárdenas, Ehab Al-Shaer, editors, Proceedings of the 6th Annual Symposium on Hot Topics in the Science of Security, HotSoS 2019, Nashville, TN, USA, April 1-3, 2019. ACM, 2019. [doi]

Authors

John Heaps

This author has not been identified. Look up 'John Heaps' in Google

Xueling Zhang

This author has not been identified. Look up 'Xueling Zhang' in Google

Xiaoyin Wang

This author has not been identified. Look up 'Xiaoyin Wang' in Google

Travis D. Breaux

This author has not been identified. Look up 'Travis D. Breaux' in Google

Jianwei Niu 0001

This author has not been identified. Look up 'Jianwei Niu 0001' in Google