John Heaps, Xueling Zhang, Xiaoyin Wang, Travis D. Breaux, Jianwei Niu 0001. Toward a reliability measurement framework automated using deep learning. In Xenofon D. Koutsoukos, Alvaro A. Cárdenas, Ehab Al-Shaer, editors, Proceedings of the 6th Annual Symposium on Hot Topics in the Science of Security, HotSoS 2019, Nashville, TN, USA, April 1-3, 2019. ACM, 2019. [doi]
Abstract is missing.