Jeff Hebert. Predicting rare failure events using classification trees on large scale manufacturing data with complex interactions. In James Joshi, George Karypis, Ling Liu, Xiaohua Hu, Ronay Ak, Yinglong Xia, Weijia Xu, Aki-Hiro Sato, Sudarsan Rachuri, Lyle H. Ungar, Philip S. Yu, Rama Govindaraju, Toyotaro Suzumura, editors, 2016 IEEE International Conference on Big Data, BigData 2016, Washington DC, USA, December 5-8, 2016. pages 2024-2028, IEEE, 2016. [doi]
Abstract is missing.