Myron Hecht, David Baum, Joe Betser. Automated Failure Modes and Effects Analysis using SysML for Industrial Computer Network Reliability and Cybersecurity. In Joe Betser, Carol J. Fung, Alex Clemm, Jérôme François, Shingo Ata, editors, IFIP/IEEE International Symposium on Integrated Network Management, IM 2019, Washington, DC, USA, April 09-11, 2019. pages 500-514, IFIP, 2019. [doi]
@inproceedings{HechtBB19,
title = {Automated Failure Modes and Effects Analysis using SysML for Industrial Computer Network Reliability and Cybersecurity},
author = {Myron Hecht and David Baum and Joe Betser},
year = {2019},
url = {http://ieeexplore.ieee.org/document/8717795},
researchr = {https://researchr.org/publication/HechtBB19},
cites = {0},
citedby = {0},
pages = {500-514},
booktitle = {IFIP/IEEE International Symposium on Integrated Network Management, IM 2019, Washington, DC, USA, April 09-11, 2019},
editor = {Joe Betser and Carol J. Fung and Alex Clemm and Jérôme François and Shingo Ata},
publisher = {IFIP},
isbn = {978-3-903176-15-7},
}