Computational Techniques for Accompaniment and Measuring of Otology Pathologies

V. Heck Jr., Aldo von Wangenheim, Daniel D. Abdala, Eros Comunello, S. S. Costa, C. C. Dornelles. Computational Techniques for Accompaniment and Measuring of Otology Pathologies. In 20th IEEE International Symposium on Computer-Based Medical Systems (CBMS 2007), 20-22 June 2007, Maribor, Slovenia. pages 53-58, IEEE Computer Society, 2007. [doi]

Abstract

Abstract is missing.