Feature Selection for Unsupervised Anomaly Detection and Localization Using Synthetic Defects

Lars Heckler, Rebecca König. Feature Selection for Unsupervised Anomaly Detection and Localization Using Synthetic Defects. In Petia Radeva, Antonino Furnari, Kadi Bouatouch, A. Augusto de Sousa, editors, Proceedings of the 19th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2024, Volume 3: VISAPP, Rome, Italy, February 27-29, 2024. pages 154-165, SCITEPRESS, 2024. [doi]

Abstract

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