Michael A. Hedderich, Jonas Fischer, Dietrich Klakow, Jilles Vreeken. Label-Descriptive Patterns and Their Application to Characterizing Classification Errors. In Kamalika Chaudhuri, Stefanie Jegelka, Le Song, Csaba Szepesvári, Gang Niu 0001, Sivan Sabato, editors, International Conference on Machine Learning, ICML 2022, 17-23 July 2022, Baltimore, Maryland, USA. Volume 162 of Proceedings of Machine Learning Research, pages 8691-8707, PMLR, 2022. [doi]
Abstract is missing.