M. Heer, V. Dubec, Scrgey Bychikhin, Dionyz Pogany, E. Gornik, M. Frank, A. Konrad, J. Schulz. Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up. Microelectronics Reliability, 46(9-11):1591-1596, 2006. [doi]
@article{HeerDBPGFKS06,
title = {Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up},
author = {M. Heer and V. Dubec and Scrgey Bychikhin and Dionyz Pogany and E. Gornik and M. Frank and A. Konrad and J. Schulz},
year = {2006},
doi = {10.1016/j.microrel.2006.07.040},
url = {http://dx.doi.org/10.1016/j.microrel.2006.07.040},
tags = {analysis, e-science},
researchr = {https://researchr.org/publication/HeerDBPGFKS06},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {9-11},
pages = {1591-1596},
}