Tino Heijmen. Soft-Error Vulnerability of Sub-100-nm Flip-Flops. In 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece. pages 247-252, IEEE, 2008. [doi]
@inproceedings{Heijmen08a,
title = {Soft-Error Vulnerability of Sub-100-nm Flip-Flops},
author = {Tino Heijmen},
year = {2008},
doi = {10.1109/IOLTS.2008.12},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2008.12},
researchr = {https://researchr.org/publication/Heijmen08a},
cites = {0},
citedby = {0},
pages = {247-252},
booktitle = {14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece},
publisher = {IEEE},
isbn = {978-0-7695-3264-6},
}