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Hilbertian Metrics on Probability Measures and Their Application in SVM?s

Matthias Hein, Thomas Navin Lal, Olivier Bousquet. Hilbertian Metrics on Probability Measures and Their Application in SVM?s. In Carl Edward Rasmussen, Heinrich H. Bülthoff, Bernhard Schölkopf, Martin A. Giese, editors, Pattern Recognition, 26th DAGM Symposium, August 30 - September 1, 2004, Tübingen, Germany, Proceedings. Volume 3175 of Lecture Notes in Computer Science, pages 270-277, Springer, 2004. [doi]

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Matthias Hein

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Thomas Navin Lal

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Olivier Bousquet

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