Hilbertian Metrics on Probability Measures and Their Application in SVM?s

Matthias Hein, Thomas Navin Lal, Olivier Bousquet. Hilbertian Metrics on Probability Measures and Their Application in SVM?s. In Carl Edward Rasmussen, Heinrich H. Bülthoff, Bernhard Schölkopf, Martin A. Giese, editors, Pattern Recognition, 26th DAGM Symposium, August 30 - September 1, 2004, Tübingen, Germany, Proceedings. Volume 3175 of Lecture Notes in Computer Science, pages 270-277, Springer, 2004. [doi]

@inproceedings{HeinLB04,
  title = {Hilbertian Metrics on Probability Measures and Their Application in SVM?s},
  author = {Matthias Hein and Thomas Navin Lal and Olivier Bousquet},
  year = {2004},
  url = {http://springerlink.metapress.com/openurl.asp?genre=article&issn=0302-9743&volume=3175&spage=270},
  researchr = {https://researchr.org/publication/HeinLB04},
  cites = {0},
  citedby = {0},
  pages = {270-277},
  booktitle = {Pattern Recognition, 26th DAGM Symposium, August 30 - September 1, 2004, Tübingen, Germany, Proceedings},
  editor = {Carl Edward Rasmussen and Heinrich H. Bülthoff and Bernhard Schölkopf and Martin A. Giese},
  volume = {3175},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {3-540-22945-0},
}