Edith Heiter, Liesbet Martens, Ruth Seurinck, Martin Guilliams, Tijl De Bie, Yvan Saeys, Jefrey Lijffijt. Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE. In Albert Bifet, Povilas Daniusis, Jesse Davis, Tomas Krilavicius, Meelis Kull, Eirini Ntoutsi, Kai Puolamäki, Indre Zliobaite, editors, Machine Learning and Knowledge Discovery in Databases. Research Track and Demo Track - European Conference, ECML PKDD 2024, Vilnius, Lithuania, September 9-13, 2024, Proceedings, Part VIII. Volume 14948 of Lecture Notes in Computer Science, pages 379-382, Springer, 2024. [doi]
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