Crop Yield Prediction: An Operational Approach to Crop Yield Modeling on Field and Subfield Level with Machine Learning Models

Patrick Helber, Benjamin Bischke, Peter Habelitz, Cristhian Sanchez, Deepak Pathak, Miro Miranda, Hiba Najjar, Francisco Mena, Jayanth Siddamsetty, Diego Arenas, Michaela Vollmer, Marcela Charfuelan, Marlon Nuske, Andreas Dengel 0001. Crop Yield Prediction: An Operational Approach to Crop Yield Modeling on Field and Subfield Level with Machine Learning Models. In IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2023, Pasadena, CA, USA, July 16-21, 2023. pages 2763-2766, IEEE, 2023. [doi]

@inproceedings{HelberBHSPMNMSAVCND23,
  title = {Crop Yield Prediction: An Operational Approach to Crop Yield Modeling on Field and Subfield Level with Machine Learning Models},
  author = {Patrick Helber and Benjamin Bischke and Peter Habelitz and Cristhian Sanchez and Deepak Pathak and Miro Miranda and Hiba Najjar and Francisco Mena and Jayanth Siddamsetty and Diego Arenas and Michaela Vollmer and Marcela Charfuelan and Marlon Nuske and Andreas Dengel 0001},
  year = {2023},
  doi = {10.1109/IGARSS52108.2023.10283302},
  url = {https://doi.org/10.1109/IGARSS52108.2023.10283302},
  researchr = {https://researchr.org/publication/HelberBHSPMNMSAVCND23},
  cites = {0},
  citedby = {0},
  pages = {2763-2766},
  booktitle = {IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2023, Pasadena, CA, USA, July 16-21, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-2010-7},
}