Patrick Helber, Benjamin Bischke, Peter Habelitz, Cristhian Sanchez, Deepak Pathak, Miro Miranda, Hiba Najjar, Francisco Mena, Jayanth Siddamsetty, Diego Arenas, Michaela Vollmer, Marcela Charfuelan, Marlon Nuske, Andreas Dengel 0001. Crop Yield Prediction: An Operational Approach to Crop Yield Modeling on Field and Subfield Level with Machine Learning Models. In IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2023, Pasadena, CA, USA, July 16-21, 2023. pages 2763-2766, IEEE, 2023. [doi]
Abstract is missing.