Ultra sensitive measurement of dielectric current under pulsed stress conditions

Clemens Helfmeier, Anne Beyreuther, Alexander Fox, Christian Boit. Ultra sensitive measurement of dielectric current under pulsed stress conditions. Microelectronics Reliability, 55(11):2254-2257, 2015. [doi]

Authors

Clemens Helfmeier

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Anne Beyreuther

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Alexander Fox

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Christian Boit

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