Sybille Hellebrand, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, Hans-Joachim Wunderlich. FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-8, IEEE, 2014. [doi]
@inproceedings{HellebrandIKKLW14,
title = {FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects},
author = {Sybille Hellebrand and Thomas Indlekofer and Matthias Kampmann and Michael A. Kochte and Chang Liu and Hans-Joachim Wunderlich},
year = {2014},
doi = {10.1109/TEST.2014.7035360},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035360},
researchr = {https://researchr.org/publication/HellebrandIKKLW14},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4722-5},
}