Nico Hellwege, Nils Heidmann, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul. An aging-aware transistor sizing tool regarding BTI and HCD degradation modes. In 22nd International Conference Mixed Design of Integrated Circuits & Systems, MIXDES 2015, Torun, Poland, June 25-27, 2015. pages 272-277, IEEE, 2015. [doi]
@inproceedings{HellwegeHEPP15,
title = {An aging-aware transistor sizing tool regarding BTI and HCD degradation modes},
author = {Nico Hellwege and Nils Heidmann and Marco Erstling and Dagmar Peters-Drolshagen and Steffen Paul},
year = {2015},
doi = {10.1109/MIXDES.2015.7208525},
url = {http://dx.doi.org/10.1109/MIXDES.2015.7208525},
researchr = {https://researchr.org/publication/HellwegeHEPP15},
cites = {0},
citedby = {0},
pages = {272-277},
booktitle = {22nd International Conference Mixed Design of Integrated Circuits & Systems, MIXDES 2015, Torun, Poland, June 25-27, 2015},
publisher = {IEEE},
isbn = {978-8-3635-7807-7},
}