An aging-aware transistor sizing tool regarding BTI and HCD degradation modes

Nico Hellwege, Nils Heidmann, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul. An aging-aware transistor sizing tool regarding BTI and HCD degradation modes. In 22nd International Conference Mixed Design of Integrated Circuits & Systems, MIXDES 2015, Torun, Poland, June 25-27, 2015. pages 272-277, IEEE, 2015. [doi]

Abstract

Abstract is missing.