David Hély, Vincent Beroulle, Feng Lu, José Ramón García Oya. Towards an unified IP verification and robustness analysis platform. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 53-58, IEEE, 2011. [doi]
@inproceedings{HelyBLO11,
title = {Towards an unified IP verification and robustness analysis platform},
author = {David Hély and Vincent Beroulle and Feng Lu and José Ramón García Oya},
year = {2011},
doi = {10.1109/DDECS.2011.5783046},
url = {http://dx.doi.org/10.1109/DDECS.2011.5783046},
researchr = {https://researchr.org/publication/HelyBLO11},
cites = {0},
citedby = {0},
pages = {53-58},
booktitle = {14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011},
editor = {Rolf Kraemer and Adam Pawlak and Andreas Steininger and Mario Schölzel and Jaan Raik and Heinrich Theodor Vierhaus},
publisher = {IEEE},
isbn = {978-1-4244-9755-3},
}