David Hély, Vincent Beroulle, Feng Lu, José Ramón García Oya. Towards an unified IP verification and robustness analysis platform. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 53-58, IEEE, 2011. [doi]
Abstract is missing.