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Comparing white-box and black-box test prioritization

Christopher Henard, Mike Papadakis, Mark Harman, Yue Jia, Yves Le Traon. Comparing white-box and black-box test prioritization. In Laura K. Dillon, Willem Visser, Laurie Williams, editors, Proceedings of the 38th International Conference on Software Engineering, ICSE 2016, Austin, TX, USA, May 14-22, 2016. pages 523-534, ACM, 2016. [doi]

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Christopher Henard

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Mike Papadakis

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Mark Harman

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Yue Jia

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Yves Le Traon

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