Comparing white-box and black-box test prioritization

Christopher Henard, Mike Papadakis, Mark Harman, Yue Jia, Yves Le Traon. Comparing white-box and black-box test prioritization. In Laura K. Dillon, Willem Visser, Laurie Williams, editors, Proceedings of the 38th International Conference on Software Engineering, ICSE 2016, Austin, TX, USA, May 14-22, 2016. pages 523-534, ACM, 2016. [doi]

@inproceedings{HenardPHJT16,
  title = {Comparing white-box and black-box test prioritization},
  author = {Christopher Henard and Mike Papadakis and Mark Harman and Yue Jia and Yves Le Traon},
  year = {2016},
  doi = {10.1145/2884781.2884791},
  url = {http://doi.acm.org/10.1145/2884781.2884791},
  researchr = {https://researchr.org/publication/HenardPHJT16},
  cites = {0},
  citedby = {0},
  pages = {523-534},
  booktitle = {Proceedings of the 38th International Conference on Software Engineering, ICSE 2016, Austin, TX, USA, May 14-22, 2016},
  editor = {Laura K. Dillon and Willem Visser and Laurie Williams},
  publisher = {ACM},
  isbn = {978-1-4503-3900-1},
}