Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon. Multi-objective test generation for software product lines. In Tomoji Kishi, Stan Jarzabek, Stefania Gnesi, editors, 17th International Software Product Line Conference, SPLC 2013, Tokyo, Japan - August 26 - 30, 2013. pages 62-71, ACM, 2013. [doi]
Abstract is missing.