Keith Henderson, Tina Eliassi-Rad, Christos Faloutsos, Leman Akoglu, Lei Li, Koji Maruhashi, B. Aditya Prakash, Hanghang Tong. Metric forensics: a multi-level approach for mining volatile graphs. In Bharat Rao, Balaji Krishnapuram, Andrew Tomkins, Qiang Yang, editors, Proceedings of the 16th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, Washington, DC, USA, July 25-28, 2010. pages 163-172, ACM, 2010. [doi]
Abstract is missing.