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The generalized Radon transform: Sampling, accuracy and memory considerations

Cris L. Luengo Hendriks, Michael van Ginkel, Piet W. Verbeek, Lucas J. van Vliet. The generalized Radon transform: Sampling, accuracy and memory considerations. Pattern Recognition, 38(12):2494-2505, 2005. [doi]

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Cris L. Luengo Hendriks

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Michael van Ginkel

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Piet W. Verbeek

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Lucas J. van Vliet

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