Cris L. Luengo Hendriks, Michael van Ginkel, Piet W. Verbeek, Lucas J. van Vliet. The generalized Radon transform: Sampling, accuracy and memory considerations. Pattern Recognition, 38(12):2494-2505, 2005. [doi]
@article{HendriksGVV05,
title = {The generalized Radon transform: Sampling, accuracy and memory considerations},
author = {Cris L. Luengo Hendriks and Michael van Ginkel and Piet W. Verbeek and Lucas J. van Vliet},
year = {2005},
doi = {10.1016/j.patcog.2005.04.018},
url = {http://dx.doi.org/10.1016/j.patcog.2005.04.018},
researchr = {https://researchr.org/publication/HendriksGVV05},
cites = {0},
citedby = {0},
journal = {Pattern Recognition},
volume = {38},
number = {12},
pages = {2494-2505},
}