Analysis of Eigenvalue Correction Applied to Biometrics

Anne Hendrikse, Raymond N. J. Veldhuis, Luuk J. Spreeuwers, Asker M. Bazen. Analysis of Eigenvalue Correction Applied to Biometrics. In Massimo Tistarelli, Mark S. Nixon, editors, Advances in Biometrics, Third International Conference, ICB 2009, Alghero, Italy, June 2-5, 2009. Proceedings. Volume 5558 of Lecture Notes in Computer Science, pages 189-198, Springer, 2009. [doi]

@inproceedings{HendrikseVSB09,
  title = {Analysis of Eigenvalue Correction Applied to Biometrics},
  author = {Anne Hendrikse and Raymond N. J. Veldhuis and Luuk J. Spreeuwers and Asker M. Bazen},
  year = {2009},
  doi = {10.1007/978-3-642-01793-3_20},
  url = {http://dx.doi.org/10.1007/978-3-642-01793-3_20},
  tags = {analysis},
  researchr = {https://researchr.org/publication/HendrikseVSB09},
  cites = {0},
  citedby = {0},
  pages = {189-198},
  booktitle = {Advances in Biometrics, Third International Conference, ICB 2009, Alghero, Italy, June 2-5, 2009. Proceedings},
  editor = {Massimo Tistarelli and Mark S. Nixon},
  volume = {5558},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {978-3-642-01792-6},
}