Anne Hendrikse, Raymond N. J. Veldhuis, Luuk J. Spreeuwers, Asker M. Bazen. Analysis of Eigenvalue Correction Applied to Biometrics. In Massimo Tistarelli, Mark S. Nixon, editors, Advances in Biometrics, Third International Conference, ICB 2009, Alghero, Italy, June 2-5, 2009. Proceedings. Volume 5558 of Lecture Notes in Computer Science, pages 189-198, Springer, 2009. [doi]
Abstract is missing.