Evaluating Experiments for Estimating the Bit Failure Cross-Section of Semiconductors Using a Colored Spectrum Neutron Beam

Nicolas W. Hengartner, Sarah Ellen Michalak, Bruce E. Takala, Stephen A. Wender. Evaluating Experiments for Estimating the Bit Failure Cross-Section of Semiconductors Using a Colored Spectrum Neutron Beam. Technometrics, 50(1):8-14, 2008. [doi]

Authors

Nicolas W. Hengartner

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Sarah Ellen Michalak

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Bruce E. Takala

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Stephen A. Wender

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