Nicolas W. Hengartner, Sarah Ellen Michalak, Bruce E. Takala, Stephen A. Wender. Evaluating Experiments for Estimating the Bit Failure Cross-Section of Semiconductors Using a Colored Spectrum Neutron Beam. Technometrics, 50(1):8-14, 2008. [doi]
@article{HengartnerMTW08,
title = {Evaluating Experiments for Estimating the Bit Failure Cross-Section of Semiconductors Using a Colored Spectrum Neutron Beam},
author = {Nicolas W. Hengartner and Sarah Ellen Michalak and Bruce E. Takala and Stephen A. Wender},
year = {2008},
doi = {10.1198/004017007000000461},
url = {http://dx.doi.org/10.1198/004017007000000461},
researchr = {https://researchr.org/publication/HengartnerMTW08},
cites = {0},
citedby = {0},
journal = {Technometrics},
volume = {50},
number = {1},
pages = {8-14},
}