Werner Henkel, Abderraheem M. Turjman, Hayoung Kim, Hisham K. H. Qanadilo. Common Randomness for Physical-Layer Key Generation in Power-Line Transmission. In 2020 IEEE International Conference on Communications, ICC 2020, Dublin, Ireland, June 7-11, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{HenkelTKQ20, title = {Common Randomness for Physical-Layer Key Generation in Power-Line Transmission}, author = {Werner Henkel and Abderraheem M. Turjman and Hayoung Kim and Hisham K. H. Qanadilo}, year = {2020}, doi = {10.1109/ICC40277.2020.9148991}, url = {https://doi.org/10.1109/ICC40277.2020.9148991}, researchr = {https://researchr.org/publication/HenkelTKQ20}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {2020 IEEE International Conference on Communications, ICC 2020, Dublin, Ireland, June 7-11, 2020}, publisher = {IEEE}, isbn = {978-1-7281-5089-5}, }