Common Randomness for Physical-Layer Key Generation in Power-Line Transmission

Werner Henkel, Abderraheem M. Turjman, Hayoung Kim, Hisham K. H. Qanadilo. Common Randomness for Physical-Layer Key Generation in Power-Line Transmission. In 2020 IEEE International Conference on Communications, ICC 2020, Dublin, Ireland, June 7-11, 2020. pages 1-6, IEEE, 2020. [doi]

Abstract

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