Tests of Hermetically Sealed LSI/VLSI Devices by Laser Photoexcitation Logic Analysis - researchr publication

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Francois J. Henley. Tests of Hermetically Sealed LSI/VLSI Devices by Laser Photoexcitation Logic Analysis. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 607-611, IEEE Computer Society, 1986.

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