Issues concerning charged device model ESD verification modules - the need to move to alumina

L. G. Henry, M. A. Kelly, T. Diep, J. Barth. Issues concerning charged device model ESD verification modules - the need to move to alumina. Microelectronics Reliability, 41(3):407-415, 2001. [doi]

Authors

L. G. Henry

This author has not been identified. Look up 'L. G. Henry' in Google

M. A. Kelly

This author has not been identified. Look up 'M. A. Kelly' in Google

T. Diep

This author has not been identified. Look up 'T. Diep' in Google

J. Barth

This author has not been identified. Look up 'J. Barth' in Google