L. G. Henry, M. A. Kelly, T. Diep, J. Barth. Issues concerning charged device model ESD verification modules - the need to move to alumina. Microelectronics Reliability, 41(3):407-415, 2001. [doi]
@article{HenryKDB01,
title = {Issues concerning charged device model ESD verification modules - the need to move to alumina},
author = {L. G. Henry and M. A. Kelly and T. Diep and J. Barth},
year = {2001},
doi = {10.1016/S0026-2714(00)00237-7},
url = {http://dx.doi.org/10.1016/S0026-2714(00)00237-7},
researchr = {https://researchr.org/publication/HenryKDB01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {3},
pages = {407-415},
}