Performance evaluation of SRAM cells in 22nm predictive CMOS technology

David Hentrich, Erdal Oruklu, Jafar Saniie. Performance evaluation of SRAM cells in 22nm predictive CMOS technology. In 2009 IEEE International Conference on Electro/Information Technology, EIT 2009, Windsor, Ontario, Canada, June 7-9, 2009. pages 470-475, IEEE, 2009. [doi]

Authors

David Hentrich

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Erdal Oruklu

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Jafar Saniie

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