David Hentrich, Erdal Oruklu, Jafar Saniie. Performance evaluation of SRAM cells in 22nm predictive CMOS technology. In 2009 IEEE International Conference on Electro/Information Technology, EIT 2009, Windsor, Ontario, Canada, June 7-9, 2009. pages 470-475, IEEE, 2009. [doi]
@inproceedings{HentrichOS09, title = {Performance evaluation of SRAM cells in 22nm predictive CMOS technology}, author = {David Hentrich and Erdal Oruklu and Jafar Saniie}, year = {2009}, doi = {10.1109/EIT.2009.5189662}, url = {http://dx.doi.org/10.1109/EIT.2009.5189662}, researchr = {https://researchr.org/publication/HentrichOS09}, cites = {0}, citedby = {0}, pages = {470-475}, booktitle = {2009 IEEE International Conference on Electro/Information Technology, EIT 2009, Windsor, Ontario, Canada, June 7-9, 2009}, publisher = {IEEE}, isbn = {978-1-4244-3355-1}, }