Seongjae Heo, Dongmin Kim, Wooseok Choi, Sanghyun Ban, Ohhyuk Kwon, Hyunsang Hwang. Experimental Demonstration of Probabilistic-Bit (p-bit) Utilizing Stochastic Oscillation of Threshold Switch Device. In 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, Japan, June 11-16, 2023. pages 1-2, IEEE, 2023. [doi]
@inproceedings{HeoKCBKH23,
title = {Experimental Demonstration of Probabilistic-Bit (p-bit) Utilizing Stochastic Oscillation of Threshold Switch Device},
author = {Seongjae Heo and Dongmin Kim and Wooseok Choi and Sanghyun Ban and Ohhyuk Kwon and Hyunsang Hwang},
year = {2023},
doi = {10.23919/VLSITechnologyandCir57934.2023.10185217},
url = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185217},
researchr = {https://researchr.org/publication/HeoKCBKH23},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, Japan, June 11-16, 2023},
publisher = {IEEE},
isbn = {978-4-86348-806-9},
}