OFDM performance analysis in the phase noise arising from the hot-carrier effect - researchr publication authors

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Sameer R. Herlekar, Chi Zhang, Hsiao-Chun Wu, Ashok Srivastava, Yiyan Wu. OFDM performance analysis in the phase noise arising from the hot-carrier effect. IEEE Trans. Consumer Electronics, 52(3):757-765, 2006. [doi]

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