OFDM performance analysis in the phase noise arising from the hot-carrier effect

Sameer R. Herlekar, Chi Zhang, Hsiao-Chun Wu, Ashok Srivastava, Yiyan Wu. OFDM performance analysis in the phase noise arising from the hot-carrier effect. IEEE Trans. Consumer Electronics, 52(3):757-765, 2006. [doi]

@article{HerlekarZWSW06,
  title = {OFDM performance analysis in the phase noise arising from the hot-carrier effect},
  author = {Sameer R. Herlekar and Chi Zhang and Hsiao-Chun Wu and Ashok Srivastava and Yiyan Wu},
  year = {2006},
  doi = {10.1109/TCE.2006.1706467},
  url = {http://dx.doi.org/10.1109/TCE.2006.1706467},
  researchr = {https://researchr.org/publication/HerlekarZWSW06},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Consumer Electronics},
  volume = {52},
  number = {3},
  pages = {757-765},
}